Digital Electronics Scanning Probe Microscope Specifications
Nanoscope IV Controller Dimension 310™ SPM Head
Sample Specifications |
|
Max Sample Size |
Wafers and disk media (8-inch dia. X 0.5" thick) |
Inspectable Area |
100mm X 125mm typical Includes interchangeable adapters for centering hard disks and removable wafer locating pins. Vacuum pump included. |
Small Samples |
Magnetic holder available for mounting small samples on mounting pucks (< 15 mm dia. typ.). |
Silicon Wafers |
Silicon-dioxide-coated chuck accommodates 2-inch, 100, 125, 150, and 200 mm wafers |
Wet Samples |
Optional fluid cell allows immersion of microscope head to max depth of 7 mm. |
Chuck Vacuum |
The chuck vacuum pneumatics secure samples to the chuck using a separate toggle switch at the front of the stage control electronics box. |
Scanner Tube Piezo Tube Specifications |
|
Travel (approximate scan size) |
|
x-axis |
90 μm |
y-axis |
90 μm |
z-axis |
6 μm |
Electronic Resolution |
16-bit (all axes) |
Orthogonality |
2 degrees |
Uncorrected Z bow |
|
90 μm scan size |
50nm |
10 μm scan size |
2 nm |
Integrated zoom optical microscope's features include: |
|
10x objective (long working distance) |
|
2X TV camera tube |
|
Motorized zoom system |
|
410-1845 x magnification range with 13-inch monitor and corresponding field of view of 180-810 μm |
|
Motorized focus |
|
Through-the-lens illumination |
|
Color Video Camera |
|
Focus tracking and automated engagement |
|
Noise- <0.5 ÅRMS in vertical (Z) dimension with acoustic/vibration isolation |
Stage |
Enhanced motorized positioning |
125 x 100 mm inspectable area |
2 μm resolution |
3 μm repeatability unidirectional (10 μm max) |
4 μm repeatability bidirectional for X-axis, 6 μm for Y-axis |
Analysis Techniques Available |
|
Analyze |
Modify |
Autocovariance |
Clean Image |
AutoStepheight |
Contrast Enhancement |
Bearing |
Convolution |
Bearing Compare |
Detrend |
Bump Analysis |
Erase Scan Lines |
Depth |
Edge Enhance |
Grain Size |
Flatten |
Grain Size Average |
Gaussian |
Particle Analysis |
Geometric |
Power Spectral Density |
Highpass |
PSD Compare |
Invert |
Roughness |
Lowpass |
Section |
Median |
Stepheight |
Plane Fit Auto |
Auto Tip Qual |
Plane Fit Manual |
Width |
Resize |
Trench |
Rotate |
MFM Track Width |
Spectrum 2D |
Localized Depth |
Zoom |