Magnetic Force Microscope (MFM)
In MFM, a tapping cantilever equipped with a special tip first scans over
the surface of a sample to obtain topographic information. Using lift mode,
the tip then raises just above the sample surface. The surface topography is
scanned and monitored for the influence of magnetic forces. MFM measures these
influences using the principle of force gradient detection.1
MFM Instructional Guide (pdf)
References
- Scanning Probe Microscopy Training Notebook, Digital Instruments, Veeco Metrology Group
- http://www.digitalinstruments.com/
