Electric Force Microscope (EFM)
Electric Force Microscopy is analogous to standard MFM, except that gradients
being sensed are due to electrostatic forces. In this method the cantilever is
vibrated by a small piezoelectric element near its resonant frequency. The
cantilever's resonant frequency changes in response to any additional force gradient.
1
Attractive forces make the cantilever effectively "softer", reducing the cantilever resonant frequency. Conversely, repulsive forces make the cantilever effectively "stiffer", increasing the resonant frequency.1
References
- Scanning Probe Microscopy Training Notebook, Digital Instruments, Veeco Metrology Group
- http://www.digitalinstruments.com/
