Hitachi S-4700 FE-SEM with EDAX


The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope.  The FE-SEM has a magnification range between 30X and 500,000X with spatial resolution of up to 1.5 nm at 15 kV, 12 mm WD and 2.5 nm at 1 k, 2.5 mm WD.  Ditigal images may be acquired in BMP, TIFF, ot JPEG file formats.  Elemental analysis of a sample can be performed using EDAX Energy Dispersive X-Ray Spectroscopy capabilites.