Magnetic Force Microscope (MFM)

MFM image 2Tapping topographical imageIn MFM, a tapping cantilever equipped with a special tip first scans over the surface of a sample to obtain topographic information. Using lift mode, the tip then raises just above the sample surface. The surface topography is scanned and monitored for the influence of magnetic forces. MFM measures these influences using the principle of force gradient detection.1

MFM Instructional Guide (pdf)

References
  1. Scanning Probe Microscopy Training Notebook, Digital Instruments, Veeco Metrology Group
  2. http://www.digitalinstruments.com/